POSTPONED - Workshop on Dark Field X-ray Microscopy for EBSL2

QUICK INFORMATION
Type
Workshop
Start Date
15-04-2020 14:00
End Date
17-04-2020 12:00
Location
ESRF Auditorium
Email
dfxm-ebs@esrf.fr
Add event to calendar
iCal | vCal
Coordinator contact(s)
Eva Jahn
Sonya Girodon
Scientific contact(s)
Carsten Detlefs


Dark-field x-ray microscopy is a newly developed technique to measure orientation and strain in crystalline materials with spatial resolution down to 100 nm. At the end of the EBS shutdown, Beamline ID06 HXRM will be the first instrument worldwide to offer this technique via a general user programme. Furthermore, the project has been selected as one of the Upgrade Beamlines, EBSL2, to be constructed on ID03.

Due to the Coronavirus crisis, this workshop is postponed.

More information